Nanomanufacturing - Key control characteristics - Part 5-1: Thin-film organic/nano electronic devices - Carrier transport measurements
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Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices ¿¿¿ Measurements of charge carrier concentration
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Nanomanufacturing – Key control characteristics – Part 5-4: Energy band gap measurement of nanomaterials by electron energy loss spectroscopy (EELS)
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Nanomanufacturing - Key control characteristics - Part 6-1: Graphene-based material - Volume resistivity: four probe method
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Nanomanufacturing - Key control characteristics - Part 6-10: Graphene-based material - Sheet resistance: Terahertz time-domain spectroscopy
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Nanomanufacturing – Key Control Characteristics – Part 6-12: Graphene – Number of layers: Raman spectroscopy, optical reflection
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Nanomanufacturing - Key control characteristics - Part 6-13: Graphene powder - Oxygen functional group content: Boehm titration method
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Corrigendum 1 - Nanomanufacturing - Key control characteristics - Part 6-13: Graphene powder - Oxygen functional group content: Boehm titration method
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Nanomanufacturing - Key control characteristics - Part 6-14: Graphene-based material - Defect level: Raman spectroscopy
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Nanomanufacturing – Key control characteristics – Part 6-16: Two-dimensional materials – Carrier concentration: Field effect transistor method
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