AENOR UNE-EN 14187-8 PDF

Name:
AENOR UNE-EN 14187-8 PDF

Published Date:
03/12/2004

Status:
[ Revised ]

Description:

Productos de sellado aplicados en frío. Parte 8: Método de ensayo para la determinación del envejecimiento artificial por radiación ultravioleta (UV).

Publisher:
Spanish Association for Standardization and Certification

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

SPANISH

Edition :	04
File Size :	1 file , 160 KB
Number of Pages :	12
Published :	03/12/2004

History

AENOR UNE-EN 14187-8

Published Date: 07/26/2017

Productos de sellado aplicados en frío. Métodos de ensayo. Parte 8: Determinación del envejecimiento artificial por radiación ultravioleta (UV).

$17.4

AENOR UNE-EN 14187-8

Published Date: 03/12/2004

Productos de sellado aplicados en frío. Parte 8: Método de ensayo para la determinación del envejecimiento artificial por radiación ultravioleta (UV).

$15.9

Related products

AENOR UNE-EN ISO 2320

Published Date: 12/13/2017

Fasteners - Prevailing torque steel nuts - Functional properties (ISO 2320:2015)

$28.8

AENOR UNE 56905

Published Date: 10/15/1974

AGLOMERADO EXPANDIDO PURO DE CORCHO PARA AISLAMIENTO TERMICO. PLACAS. DETERMINACION DE DIMENSIONES

$4.8

AENOR UNE 26019

Published Date:

Tambores de freno. Diámetros de la superficie de freno.

$6.3

AENOR UNE-EN 60398

Published Date: 02/26/2001

Instalaciones electrotérmicas industriales. Métodos generales de ensayo.

$19.5

Best-Selling Products

ISO/TTA 1:1994

Published Date: 04/01/1994

Advanced technical ceramics - Unified classification system

$55.5

ISO/TTA 2:1997

Published Date: 04/01/1997

Tensile tests for discontinuously reinforced metal matrix composites at ambiant temperatures

$33.3

ISO/TTA 3:2001

Published Date: 09/01/2001

Polycrystalline materials - Determination of residual stresses by neutron diffraction

$55.5

ISO/TTA 4:2002

Published Date: 11/01/2002

Measurement of thermal conductivity of thin films on silicon substrates

$41.4

ISO/TTA 5:2007

Published Date: 10/01/2007

Code of practice for creep/fatigue testing of cracked components

$75