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X9 X9.100-30-2011 (R2017) PDF

X9 X9.100-30-2011 (R2017) PDF

Name:
X9 X9.100-30-2011 (R2017) PDF

Published Date:
08/09/2011

Status:
Active

Description:

Optical Background Measurement for MICR Documents

Publisher:
Accredited Standards Committee X9 Incorporated

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$18
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ANSI X9.100-30-2011 (R2017) is the specification of the optical measurement methodology for the parameters of reflectance, PCS, DCR, Paxel Count, and opacity which are needed for MICR documents.
ANSI : ANSI Approved
File Size : 1 file , 770 KB
Number of Pages : 35
Published : 08/09/2011

History

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