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AS ISO 14237-2006 PDF

AS ISO 14237-2006 PDF

Name:
AS ISO 14237-2006 PDF

Published Date:
10/20/2006

Status:
[ Withdrawn ]

Description:

Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials

Publisher:
Standards Australia

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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Choose Document Language:
$18.81
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Adopts ISO 14237:2000 to specify a secondary-ion mass spectrometric method for the determination of boron atomic concentration in single-crystalline silicon, using uniformly doped materials calibrated by a certified reference material implanted with boron.
Edition : 1st
File Size : 1 file , 690 KB
ISBN(s) : 0733777929
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 22
Product Code(s) : 10103377, 10103364, 10103400
Published : 10/20/2006

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