ASTM B878-97 PDF

ASTM B878-97 PDF

Name:
ASTM B878-97 PDF

Published Date:
01/01/1997

Status:
Active

Description:

Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors

Publisher:
ASTM International

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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Choose Document Language:
$15
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1.1 This test method describes equipment and techniques for detecting contact resistance transients yielding resistances greater than a specified value and lasting for at least a specified minimum duration.

1.2 The minimum durations specified in this standard are 1, 10, and 50 nanoseconds (ns).

1.3 The minimum sample resistance required for an event detection in this standard is 10.

1.4 An ASTM guide for measuring electrical contact transients of various durations is available as Guide B 854.

1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.


File Size : 1 file , 58 KB
Note : This product is unavailable in Russia, Ukraine, Belarus
Number of Pages : 4
Published : 01/01/1997

History

ASTM B878-97(2019)
Published Date: 11/01/2019
Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors
$17.1
ASTM B878-97(2014)
Published Date: 10/01/2014
Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors
$18
ASTM B878-97(2009)
Published Date: 04/15/2009
Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors
$15.6
ASTM B878-97(2003)
Published Date: 06/10/2003
Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors
$15.6
ASTM B878-97
Published Date: 01/01/1997
Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors
$15

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