ASTM E1829-14(2020) PDF

1.1''This guide covers specimen handling and preparation prior to surface analysis and applies to the following surface analysis disciplines:

1.1.1''Auger electron spectroscopy (AES),

1.1.2''X-ray photoelectron spectroscopy (XPS or ESCA), and

1.1.3''Secondary ion mass spectrometry (SIMS).

1.1.4''Although primarily written for AES, XPS, and SIMS, these methods may also apply to many surface-sensitive analysis methods, such as ion scattering spectrometry, low-energy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surface-sensitive measurements.

1.2''This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.3''This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.