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ASTM E2444-11e1 PDF

ASTM E2444-11e1 PDF

Name:
ASTM E2444-11e1 PDF

Published Date:
10/15/2011

Status:
Active

Description:

Terminology Relating to Measurements Taken on Thin, Reflecting Films

Publisher:
ASTM International

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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Choose Document Language:
$15
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1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section 2, which were generated by Committee E08 on Fatigue and Fracture. Terminology E1823 Relating to Fatigue and Fracture Testing is applicable to this standard.

1.2 The terms are listed in alphabetical order.


File Size : 1 file , 68 KB
Note : This product is unavailable in Russia, Ukraine, Belarus
Number of Pages : 2
Published : 10/15/2011

History

ASTM E2444-11(2018)
ASTM E2444-11(2018)
Published Date: 05/01/2018
Standard Terminology Relating to Measurements Taken on Thin, Reflecting Films
$12.6
ASTM E2444-11e1
ASTM E2444-11e1
Published Date: 10/15/2011
Terminology Relating to Measurements Taken on Thin, Reflecting Films
$15
ASTM E2444-11
ASTM E2444-11
Published Date: 10/15/2011
Terminology Relating to Measurements Taken on Thin, Reflecting Films
$15
ASTM E2444-05e1
ASTM E2444-05e1
Published Date: 05/01/2005
Terminology Relating to Measurements Taken on Thin, Reflecting Films
$15
ASTM E2444-05
ASTM E2444-05
Published Date: 05/01/2005
Terminology Relating to Measurements Taken on Thin, Reflecting Films
$16.2

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