ASTM F1263-99(2005) PDF

ASTM F1263-99(2005) PDF

Name:
ASTM F1263-99(2005) PDF

Published Date:
01/01/2005

Status:
Active

Description:

Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts

Publisher:
ASTM International

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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$15
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1.1 This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of parts at a stress higher than their specification stress in order to reduce the amount of necessary data taking. This guide discusses when and how overtesting may be applied to forming probabilistic estimates for the survival of electronic piece parts subjected to radiation stress. Some knowledge of the probability distribution governing the stress-to-failure of the parts is necessary though exact knowledge may be replaced by over-conservative estimates of this distribution.


File Size : 1 file , 64 KB
Note : This product is unavailable in Russia, Ukraine, Belarus
Number of Pages : 3
Published : 01/01/2005

History

ASTM F1263-11(2019)
Published Date: 12/01/2019
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
$15
ASTM F1263-11
Published Date: 06/01/2011
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
$15.6
ASTM F1263-99(2005)
Published Date: 01/01/2005
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
$15
ASTM F1263-99
Published Date: 12/10/1999
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
$15

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