ASTM F2073-01(2006) PDF

ASTM F2073-01(2006) PDF

Name:
ASTM F2073-01(2006) PDF

Published Date:
07/01/2006

Status:
Active

Description:

Standard Test Method for Non-Destructive Short Circuit Testing of a Membrane Switch

Publisher:
ASTM International

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
$15
Need Help?

1.1 This standard establishes a test method for detecting unwanted electrical shorts in a membrane switch.

1.2 Since this is a non-destructive test, it can be performed on a membrane switch that is going to be mounted and used in its intended environment.

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.


File Size : 1 file , 46 KB
Note : This product is unavailable in Russia, Ukraine, Belarus
Number of Pages : 2
Published : 07/01/2006
Redline File Size : 2 files , 95 KB

History

ASTM F2073-14
Published Date: 10/01/2014
Standard Test Method for Non-Destructive Short Circuit Testing of a Membrane Switch (Withdrawn 2023)
$18
ASTM F2073-01(2006)
Published Date: 07/01/2006
Standard Test Method for Non-Destructive Short Circuit Testing of a Membrane Switch
$15
ASTM F2073-01
Published Date: 06/10/2001
Standard Test Method for Non-Destructive Short Circuit Testing of a Membrane Switch
$15
ASTM F2073-00
Published Date: 01/01/2000
Standard Test Method for Non-Destructive Short Circuit Testing of a Membrane Switch
$15

Related products

ASTM F657-92(1999)
Published Date: 01/01/1999
Standard Test Method for Measuring Warp and Total Thickness Variation on Silicon Wafers by Noncontact Scanning (Withdrawn 2003)
$17.4
ASTM F674-92(1999)
Published Date: 01/01/1999
Standard Practice for Preparing Silicon for Spreading Resistance Measurements (Withdrawn 2003)
$16.2
ASTM F1530-02
Published Date: 12/10/2002
Standard Test Method for Measuring Flatness, Thickness, and Thickness Variation on Silicon Wafers by Automated Noncontact Scanning (Withdrawn 2003)
$19.5
ASTM F3-02a
Published Date: 12/10/2002
Standard Specification for Nickel Strip for Electron Tubes (Withdrawn 2008)
$15

Best-Selling Products

Gypsum Construction Handbook
Published Date: 05/01/1992
$9.9