ASTM F29-97(2002) PDF

ASTM F29-97(2002) PDF

Name:
ASTM F29-97(2002) PDF

Published Date:
01/01/2002

Status:
Active

Description:

Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications

Publisher:
ASTM International

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
$15
Need Help?

1.1 This specification covers round, copper-coated 42% nickel-iron wire, commonly known as dumet, intended primarily for sealing to soft glass.

1.2 The values stated in inch-pound units are to be regarded as the standard. The metric equivalents of inch-pound units may be approximate.


File Size : 1 file , 46 KB
Note : This product is unavailable in Russia, Ukraine, Belarus
Number of Pages : 4
Published : 01/01/2002

History

ASTM F29-97(2022)
Published Date: 05/01/2022
Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications (Withdrawn 2024)
$19.8
ASTM F29-97(2017)
Published Date: 06/01/2017
Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications
$16.8
ASTM F29-97(2012)
Published Date: 07/01/2012
Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications
$15
ASTM F29-97(2009)
Published Date: 05/01/2009
Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications
$15
ASTM F29-97(2002)
Published Date: 01/01/2002
Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications
$15
ASTM F29-97
Published Date: 01/01/1997
Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications
$15

Related products

ASTM F2072-14
Published Date: 01/01/2014
Standard Test Method for Hosedown of a Membrane Switch (Withdrawn 2023)
$18
ASTM F1578-24
Published Date: 05/15/2024
Standard Test Method for Contact Closure Cycling of a Membrane Switch
$16.5
ASTM F1893-18
Published Date: 03/01/2018
Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices (Withdrawn 2023)
$22.5
ASTM F398-92(2002)
Published Date: 01/01/2002
Standard Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum (Withdrawn 2003)
$17.4

Best-Selling Products

Ethernet : The Definitive Guide
Published Date: 02/01/2000
$13.5
Excel Annoyances
Published Date: 01/01/1999
$9
XML Pocket Reference
Published Date: 08/01/1999
$2.7