ASTM F375-89(2005) PDF

ASTM F375-89(2005) PDF

Name:
ASTM F375-89(2005) PDF

Published Date:
01/01/2005

Status:
Active

Description:

Standard Specification for Integrated Circuit Lead Frame Material

Publisher:
ASTM International

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
$15
Need Help?

1.1 This specification covers the special requirements for metal strip to be used to fabricate integrated-circuit lead frames by stamping or photochemical milling.

1.2 The metals that are applicable to these parts include copper and copper alloys, ferrous alloys usually containing nickel or cobalt or chromium, nickel and nickel alloys, and other metallic materials.

1.3 The general chemical, physical, and mechanical property requirements of these materials are covered by other ASTM specifications (specifically Specifications B103/ B103M, B122/B122M, B152, B162, B465, F15, F30, F31, F49 and F68), and these should be consulted for properties and tempers that are different for the different metals. For metals for which no ASTM specification is available, other specifications should be adopted by agreement of the parties concerned.

1.4 The values stated in inch-pound units are to be regarded as the standard. The values given in parentheses are for information only.


File Size : 1 file , 67 KB
Note : This product is unavailable in Russia, Ukraine, Belarus
Number of Pages : 3
Published : 01/01/2005
Redline File Size : 2 files , 120 KB

History

ASTM F375-20
Published Date: 09/01/2020
Standard Specification for Integrated Circuit Lead Frame Material (Withdrawn 2023)
$19.8
ASTM F375-89(2010)
Published Date: 10/01/2010
Standard Specification for Integrated Circuit Lead Frame Material
$15
ASTM F375-89(2005)
Published Date: 01/01/2005
Standard Specification for Integrated Circuit Lead Frame Material
$15
ASTM F375-89(1999)
Published Date: 01/01/1999
Standard Specification for Integrated Circuit Lead Frame Material
$15

Related products

ASTM F528-99(2005)
Published Date: 01/01/2005
Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors (Withdrawn 2011)
$17.4
ASTM F1375-92(2020)
Published Date: 04/15/2020
Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components (Withdrawn 2023)
$19.8
ASTM F1725-02
Published Date: 12/10/2002
Standard Guide for Analysis of Crystallographic Perfection of Silicon Ingots (Withdrawn 2003)
$15
ASTM F1771-97(2002)
Published Date: 01/01/2002
Standard Test Method for Evaluating Gate Oxide Integrity by Voltage Ramp Technique (Withdrawn 2003)
$17.4

Best-Selling Products