BS 08/30172398 DC PDF

Name:
BS 08/30172398 DC PDF

Published Date:
02/18/2008

Status:
Active

Description:

BS EN 62047-8. Semiconductor devices. Micro- electromechanical devices. Part 8. Strip bending test method for tensile property measurement of thin films

Publisher:
BSI Group

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

Cross References:
IEC 62047-1:2005
IEC 62047-2:2006
IEC 62047-3:2006
ISO 6892:1998
ISO 15490:2000

Number of Pages :	16
Published :	02/18/2008

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