Prescribes quality assessment procedures and test and measurement conditions applicable to semiconductor optoelectronic and liquid crystal devices.
Cross References:BS 1991
BS 2011:Part 1.1
BS 2011:Part 2.1B
BS 2011:Part 2.1Ca
BS 2011:Part 2.1Da
BS 2011:Part 2.1Db
BS 2011:Part 2.1Ea
BS 2011:Part 2.1Fc
BS 2011:Part 2.1Ga
BS 2011:Part 2.1N
BS 2011:Part 2.1Q
BS 2011:Part 2.1T
BS 2011:Part 2.1U
BS 2011:Part 2.1Z/AD
BS 2045
BS 3363
BS 3934
BS 3939
BS 4727:Part 4:Group 01
BS 5555
BS 6001
BS 9000:Part 2
BS 9300
BS E9007
ISO/R 2015
IEC 134
IEC 306
Replaced by BS EN 120000:1996 but remains current.
Incorporates the following:AMD 4606 published 31 October 1984
AMD 5800 published 28 February 1989
| File Size : | 1
file
, 6.1 MB |
| ISBN(s) : | 0580119416 |
| Note : | This product is unavailable in Ukraine, Russia, Belarus |
| Number of Pages : | 100 |
| Product Code(s) : | 150331, 150331, 00150331 |
| Published : | 06/30/1983 |
