BS EN 60679-4:1998 PDF

Published Date: 05/15/1998

Quartz crystal controlled oscillators of assessed quality-Sectional specification. Capability approval

Published Date: 08/15/1993

Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal controlled oscillators (capability approval)

Published Date: 12/13/2017

Piezoelectric, dielectric and electrostatic oscillators of assessed quality-Generic specification

Published Date: 04/15/1979

Detail specification for cold welded seal quartz crystal units for oscillator applications. DK enclosure, 6.0 to 25 MHz frequency range. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level

Published Date: 04/15/1979

Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level

Published Date: 01/01/2000

Published Date: 01/01/2001