BS EN 60749-23:2004 PDF

Name:
BS EN 60749-23:2004 PDF

Published Date:
06/24/2004

Status:
Active

Description:

Semiconductor devices. Mechanical and climatic test methods. High temperature operating life

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

Cross References:
IEC 60747
EN 60747
IEC 60749-34
EN 60749-34:2004

File Size :	1 file , 390 KB
ISBN(s) :	0580439712
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	12
Product Code(s) :	30075527, 30075527, 30075527
Published :	06/24/2004

Published Date: 06/30/2011

Semiconductor devices. Mechanical and climatic test methods-High temperature operating life

$48.006

Published Date: 06/24/2004

Semiconductor devices. Mechanical and climatic test methods. High temperature operating life

$32.766