BS EN IEC 60749-26:2018 establishes the procedure for testing, evaluating, and classifying
components and microcircuits according to their susceptibility (sensitivity) to damage or
degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD).
The purpose of this document is to establish a test method that will replicate HBM failures and
provide reliable, repeatable HBM ESD test results from tester to tester, regardless of
component type. Repeatable data will allow accurate classifications and comparisons of HBM
ESD sensitivity levels.
ESD testing of semiconductor devices is selected from this test method, the machine model
(MM) test method (see IEC 60749-27) or other ESD test methods in the IEC 60749 series.
Unless otherwise specified, this test method is the one selected.
Cross References:EN 60749-27
IEC 60749
EN 60749
IEC 60749-27
ANSI/ESDA/JEDEC JS-001:2014
All current amendments available at time of purchase are included with the purchase of this document. | File Size : | 1
file
, 1.6 MB |
| ISBN(s) : | 9780580976049 |
| Note : | This product is unavailable in Ukraine, Russia, Belarus |
| Number of Pages : | 54 |
| Product Code(s) : | 30356570, 30356570, 30356570 |
| Published : | 04/30/2018 |
