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BS IEC 62047-34:2019 PDF

BS IEC 62047-34:2019 PDF

Name:
BS IEC 62047-34:2019 PDF

Published Date:
04/16/2019

Status:
Active

Description:

Semiconductor devices. Micro-electromechanical devices-Test methods for MEMS piezoresistive pressure-sensitive device on wafer

Publisher:
British Standard / International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$57.15
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BS IEC 62047-34:2019 describes test conditions and test methods of electric character, static performances and thermal performances for MEMS pressure-sensitive devices. This document applies to test for both open and closed loop piezoresistive MEMS pressure devices on wafer.

Cross References:
IEC 60747-14-3
IEC 61193-2
ISO/IEC Guide 98-3


All current amendments available at time of purchase are included with the purchase of this document.
File Size : 1 file , 1000 KB
ISBN(s) : 9780580973918
Number of Pages : 18
Product Code(s) : 30355777, 30355777, 30355777
Published : 04/16/2019

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