This document describes procedures for measuring average grain size derived from a two-dimensional polished cross-section using electron backscatter diffraction (EBSD). This requires the measurement of orientation, misorientation and pattern quality factor as a function of position in the crystalline specimen
[1]. The measurements in this document are made on two dimensional sections. The reader should note carefully the definitions used (3.3) which draw a distinction between the measured sectional grain sizes, and the mean grain size which can be derived from them that relates to the three dimensional grain size.
All current amendments available at time of purchase are included with the purchase of this document. | File Size : | 1
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| ISBN(s) : | 9780580511011 |
| Note : | This product is unavailable in Russia, Ukraine, Belarus |
| Number of Pages : | 36 |
| Product Code(s) : | 30365237, 30365237, 30365237 |
| Published : | 07/17/2020 |
