BS ISO 20263:2017 PDF

BS ISO 20263:2017 specifies a procedure for the determination of averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered materials. It is not intended to determine the simulated interface of the multi-layered materials expected through the multi-slice simulation (MSS) method. This document is applicable to the cross-sectional images of the multi-layered materials recorded by using a transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM) and the cross-sectional elemental mapping images by using an energy dispersive X-ray spectrometer (EDS) or an electron energy loss spectrometer (EELS). This document is also applicable to the digitized image recorded on an image sensor built into a digital camera, a digital memory set in the PC or an imaging plate and the digitalized image converted from an analogue image recorded on the photographic film by an image scanner.


Cross References:
ISO 15932:2013 ED1
ISO 29301:2010
ISO/IEC Guide 98-3


All current amendments available at time of purchase are included with the purchase of this document.

File Size :	1 file , 4.8 MB
ISBN(s) :	9780580893452
Note :	This product is unavailable in Russia, Ukraine, Belarus
Number of Pages :	54
Product Code(s) :	30319121, 30319121, 30319121
Published :	01/04/2018
Same As :	BS ISO 20263:2017