This document provides an introduction to (and some examples of) the types of information that can be
obtained about nanostructured materials using surface-analysis tools (Clause 5). Of equal importance,
both general issues or challenges associated with characterizing nanostructured materials and the
specific opportunities or challenges associated with individual methods are identified (Clause 6). As
the size of objects or components of materials approaches a few nanometres, the distinctions among
"bulk", "surface" and "particle" analysis blur. Although some general issues relevant to characterization
of nanostructured materials are identified, this document focuses on issues specifically relevant to
surface chemical analysis of nanostructured materials. A variety of analytical and characterization
methods will be mentioned, but this report focuses on methods that are in the domain of ISO/TC 201
including Auger Electron Spectroscopy, X-ray photoelectron spectroscopy, secondary ion mass
spectrometry, and scanning probe microscopy. Some types of measurements of nanoparticle surface
properties such as surface potential that are often made in a solution are not discussed in this Report.
All current amendments available at time of purchase are included with the purchase of this document. | File Size : | 1
file
, 4 MB |
| ISBN(s) : | 9780539019360 |
| Note : | This product is unavailable in Ukraine, Russia, Belarus |
| Number of Pages : | 56 |
| Product Code(s) : | 30381532, 30381532, 30381532 |
| Published : | 07/03/2020 |
| Same As : | BS PD ISO/TR 14187:2020 |
