BS 08/30138809 DC PDF

Name:
BS 08/30138809 DC PDF

Published Date:
02/19/2008

Status:
Active

Description:

BS ISO 23812. Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth calibration for silicon using multiple delta-layer reference materials

Publisher:
BSI Group

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

Cross References:
ISO 18115:2001
ISO 20341:2003

Number of Pages :	24
Published :	02/19/2008

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