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BSI
BS 08/30138809 DC PDF
BS 08/30138809 DC PDF
Name:
BS 08/30138809 DC PDF
Published Date:
02/19/2008
Status:
Active
Description:
BS ISO 23812. Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth calibration for silicon using multiple delta-layer reference materials
Publisher:
BSI Group
Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
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Cross References:
ISO 18115:2001
ISO 20341:2003
Number of Pages :
24
Published :
02/19/2008
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