BS 11/30230316 DC PDF

Name:
BS 11/30230316 DC PDF

Published Date:
02/21/2011

Status:
Active

Description:

BS EN 62047-18. Semiconductor devices. Micro-electromechanical systems. Part 18. Bending test methods of thin film materials

Publisher:
BSI Group

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

Cross References:
IEC 62047-2:2006
IEC 62047-2:2006
IEC 62047-6:2009

All current amendments available at time of purchase are included with the purchase of this document.

Number of Pages :	14
Published :	02/21/2011

History

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