BS 3363:1968 PDF

BS 3363:1968 PDF

Name:
BS 3363:1968 PDF

Published Date:
02/28/1968

Status:
Active

Description:

Schedule of letter symbols for semiconductor devices.

Publisher:
BSI Group

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
$79.248
Need Help?


All current amendments available at time of purchase are included with the purchase of this document.
Note : This product is unavailable in Ukraine, Russia, Belarus
Product Code(s) : 30308376
Published : 02/28/1968

History

BS 6493-2.1:1985
Published Date: 08/06/2002
Semiconductor devices. Integrated circuits-General
$92.964
BS 3363:SUPPLEMENT NO. 2:1981
Published Date: 01/30/1981
Specification for letter symbols for semiconductor devices and integrated microcircuits
$48.006
BS 3363:1980
Published Date: 11/28/1980
Specification for letter symbols for semiconductor devices and integrated microcircuits
$79.248
BS 3363:1968
Published Date: 02/28/1968
Schedule of letter symbols for semiconductor devices.
$79.248
BS 3363:1961
Published Date: 04/26/1961
Schedule of letter symbols for light-current semiconductor devices.
$79.248

Related products

BS 1646-1:1979
Published Date: 11/30/1979
Symbolic representation for process measurement control functions and instrumentation-Basic requirements
$57.15
BS 3238-1:1960
Published Date: 05/25/1960
Graphical symbols for components of servo-mechanisms-Transductors and magnetic amplifiers
$48.006
BS EN 60617-3:1996
Published Date: 12/15/1996
Graphical symbols for diagrams-Conductors and connecting devices
$79.248
BS PD IEC/TR 60878:2022
Published Date: 04/05/2023
Graphical symbols for electrical equipment in medical practice
$22.098

Best-Selling Products

DESTRUCTIVE TESTING METHODS
Published Date: 01/01/2010
$7.5
FLUX CORED ARC WELDING
Published Date: 01/01/2012
$9
GAS METAL ARC WELDING
Published Date: 01/01/2012
$9
GAS TUNGSTEN ARC WELDING
Published Date: 01/01/2012
$9
HIWT DESTRUCTIVE TESTING METHO
Published Date: 01/01/2007
DESTRUCTIVE TESTING METHODS
NONDESTRUCTIVE TESTING METHODS
Published Date: 01/01/2009
$8.4