Documents the parametrized test structures of the JESSI Reliability Test Chip (RTC) which is part of the European Mini Test Chip (ETC).
Cross References:CENELEC Document Ref. No. R 117-001
PD 6595
CENELEC R 117-001
CENELEC R 117-005
CENELEC R 117-006
CENELEC R 117- 'Description of a Parametrized European Mini Test Chip'
CENELEC R 117- 'Data Interchange Format for Simulated and Measured Data (ISMD)'
CENELEC 'R 117- Measurement Techniques of the Reliability Test Structures of the European Mini Test Chip'
CENELEC R 117- 'Evaluation of the Reliability Test Structures of the European Mini Test Chip'
| File Size : | 1
file
, 980 KB |
| ISBN(s) : | 0580260372 |
| Note : | This product is unavailable in Ukraine, Russia, Belarus |
| Number of Pages : | 38 |
| Product Code(s) : | 835677, 835677, 00835677 |
| Published : | 09/15/1996 |
