BS EN 60749-14:2003 PDF

BS EN 60749-14:2003 PDF

Name:
BS EN 60749-14:2003 PDF

Published Date:
12/15/2003

Status:
Active

Description:

Semiconductor devices. Mechanical and climatic test methods-Robustness of terminations (lead integrity)

Publisher:
British-Adopted European Standard

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Czech version):

200 business days

SKU:

bs-en-60749-14-2003_1145304

Cross References:
IEC 60749-8
EN 60749-8:2003

Partially replaces BS EN 60749:1999.

File Size :	1 file , 350 KB
ISBN(s) :	0580430820
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	18
Product Code(s) :	30069159, 30069159, 30069159
Published :	12/15/2003

History

BS EN 60749-14:2003

BS EN 60749-14:2003

Published Date: 12/15/2003

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Semiconductor devices. Mechanical and climatic test methods

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Semiconductor devices-Mechanical and climatic test methods

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