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BS EN 60749-3:2017 PDF

BS EN 60749-3:2017 PDF

Name:
BS EN 60749-3:2017 PDF

Published Date:
11/24/2017

Status:
Active

Description:

Semiconductor devices. Mechanical and climatic test methods-External visual examination

Publisher:
British-Adopted European Standard

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$57.15
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BS EN 60749-3:2017 is to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types. The test is useful for qualification, process monitor, or lot acceptance.


Cross References:
EN 61340-5-1 (IEC 61340-5-1:2016) AS
IEC 62483:2013
IEC 61340-5-1:2016
IEC 60749-9:2017
EN 60749-9:2017


All current amendments available at time of purchase are included with the purchase of this document.
File Size : 1 file , 930 KB
ISBN(s) : 9780580948930
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 16
Product Code(s) : 30344801, 30344801, 30344801
Published : 11/24/2017

History

BS EN 60749-3:2017
BS EN 60749-3:2017
Published Date: 11/24/2017
Semiconductor devices. Mechanical and climatic test methods-External visual examination
$57.15
BS EN 60749:1999
BS EN 60749:1999
Published Date: 09/23/2002
Semiconductor devices. Mechanical and climatic test methods
$119.634
BS EN 60749-3:2002
BS EN 60749-3:2002
Published Date: 09/17/2002
Semiconductor devices. Mechanical and climatic test methods-External visual examination
$48.006
BS 6493-3:1985
BS 6493-3:1985
Published Date: 01/31/1986
Semiconductor devices-Mechanical and climatic test methods
$92.964

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