BS EN 60749-38:2008 PDF

Name:
BS EN 60749-38:2008 PDF

Published Date:
06/30/2008

Status:
Active

Description:

Semiconductor devices. Mechanical and climatic test methods-Soft error test method for semiconductor devices with memory

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

All current amendments available at time of purchase are included with the purchase of this document.

File Size :	1 file , 640 KB
ISBN(s) :	9780580548758
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	16
Product Code(s) :	30126445, 30126445, 30126445
Published :	06/30/2008

Published Date: 01/01/1996

"F" Port (Female Outdoor) Physical Dimensions (formerly IPS SP 400)

$9

Published Date: 01/01/2006

"F" Port (Female Outdoor) Physical Dimensions (formerly IPS SP 400)

$7.5

Published Date: 2021

Specification for "F" Port, Female, Outdoor

$7.5

Published Date: 01/01/2006

Specification for "F" Port, Female, Indoor

$7.5

Published Date: 2021

Specification for "F" Port, Female, Indoor

$7.5

Published Date: 01/01/2003

Test Method for Coaxial Cable Structural Return Loss (formerly IPS TP 007)

$7.5