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BS EN 60749-5:2017 PDF

BS EN 60749-5:2017 PDF

Name:
BS EN 60749-5:2017 PDF

Published Date:
07/20/2017

Status:
Active

Description:

Semiconductor devices. Mechanical and climatic test methods-Steady-state temperature humidity bias life test

Publisher:
British-Adopted European Standard

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Czech version):
200 business days
SKU:
bs-en-60749-5-2017_1987003
Choose Document Language:
57.15
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BS EN 60749-5:2017 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

This test method is considered destructive.


Cross References:
EN 60749-4:2017
IEC 60749-4:2017


All current amendments available at time of purchase are included with the purchase of this document.
File Size : 1 file , 1.9 MB
ISBN(s) : 9780580958007
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 16
Product Code(s) : 30348577, 30348577, 30348577
Published : 07/20/2017

History

BS EN 60749-5:2017
BS EN 60749-5:2017
Published Date: 07/20/2017
Semiconductor devices. Mechanical and climatic test methods-Steady-state temperature humidity bias life test
57.15 €
BS EN 60749:1999
BS EN 60749:1999
Published Date: 09/23/2002
Semiconductor devices. Mechanical and climatic test methods
119.63 €
BS 6493-3:1985
BS 6493-3:1985
Published Date: 01/31/1986
Semiconductor devices-Mechanical and climatic test methods
92.96 €

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