Semiconductor devices. Micro-electromechanical devices-Electromechanical tensile test method for conductive thin films on flexible substrates

Publisher:
British-Adopted European Standard

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

Cross References:
IEC 62047-2:2006
IEC 62047-3:2006
IEC 62047-8:2011
ISO 527-3:1995
EN 62047-2:2006
EN 62047-3:2006
EN 62047-8:2011
EN ISO 527-3:1995

All current amendments available at time of purchase are included with the purchase of this document.

File Size :	1 file , 1.3 MB
ISBN(s) :	9780580775550
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	14
Product Code(s) :	30257244, 30257244, 30257244
Published :	10/31/2014

BS EN 62047-22:2014 PDF

Semiconductor devices. Micro-electromechanical devices-Electromechanical tensile test method for conductive thin films on flexible substrates

History

Related products

Best-Selling Products