Name: BS EN 62374-1:2010 PDF
Price: 57.15 USD
Availability: InStock
Rating: 5 (70 reviews)

Name:
BS EN 62374-1:2010 PDF

Published Date:
06/30/2011

Status:
Active

Description:

Semiconductor devices-Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

All current amendments available at time of purchase are included with the purchase of this document.

File Size :	1 file , 1.3 MB
ISBN(s) :	9780580752063, 9780580603709
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	20
Product Code(s) :	30245642, 30245642, 30245642
Published :	06/30/2011

BS EN 62374-1:2010 PDF