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BS EN 62374-1:2010 PDF

BS EN 62374-1:2010 PDF

Name:
BS EN 62374-1:2010 PDF

Published Date:
06/30/2011

Status:
Active

Description:

Semiconductor devices-Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

Publisher:
British-Adopted European Standard

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Czech version):
200 business days
SKU:
bs-en-62374-1-2010_1762888
Choose Document Language:
57.15 €
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All current amendments available at time of purchase are included with the purchase of this document.
File Size : 1 file , 1.3 MB
ISBN(s) : 9780580752063, 9780580603709
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 20
Product Code(s) : 30245642, 30245642, 30245642
Published : 06/30/2011

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