BS PD IEC/TR 62396-7:2017, which is a technical report, describes a process to account for the
effects of atmospheric radiation on electronic equipment. Single event effects (SEE) due to
atmospheric radiation are one class of possible failure mechanisms that are addressed in the
safety and reliability analyses of electronic equipment and associated functions.
This document focuses on electronic components, electronic equipment and associated
electronic functions. System level analysis is not addressed in this document.
Cross References:IEC 62396-1:2016
IEC TS 62239-1:2015
IEC 62396-5:2014
IEC 62396-4:2013
IEC 62396-3:2013
IEC 62396-2:2012
ARP 4761
SAE EIA-STD-4899
JEDEC JESD89-3
SAE AIR 6219
All current amendments available at time of purchase are included with the purchase of this document. | File Size : | 1
file
, 980 KB |
| ISBN(s) : | 9780580977510 |
| Note : | This product is unavailable in Ukraine, Russia, Belarus |
| Number of Pages : | 22 |
| Product Code(s) : | 30357272, 30357272, 30357272 |
| Published : | 09/30/2017 |