BS PD IEC/TR 63133:2017 PDF

BS PD IEC/TR 63133:2017 PDF

Name:
BS PD IEC/TR 63133:2017 PDF

Published Date:
01/29/2018

Status:
Active

Description:

Semiconductor devices. Scan based ageing level estimation for semiconductor devices

Publisher:
BSI Group

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:
bs-pd-iec-tr-63133-2017_2006138

Choose Document Language:
$57.15
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BS PD IEC/TR 63133:2017 specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.


Cross References:
IEEE 1149.1:2013


All current amendments available at time of purchase are included with the purchase of this document.
File Size : 1 file , 1.4 MB
ISBN(s) : 9780580988516
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 20
Product Code(s) : 30361972, 30361972, 30361972
Published : 01/29/2018

History


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