This document gives guidelines for the characterization of single-wall carbon nanotubes (SWCNTs)
using near infrared (NIR) photoluminescence (PL) spectroscopy.
It provides a measurement method for the determination of the chiral indices of the semi-conducting
SWCNTs in a sample and their relative integrated PL intensities.
The method can be expanded to estimate the relative mass concentrations of semi-conducting SWCNTs
in a sample from their measured integrated PL intensities and knowledge of their PL cross-sections.
Cross References:ISO/TS 80004-4
ISO/TS 80004-6
All current amendments available at time of purchase are included with the purchase of this document. | File Size : | 1
file
, 2.1 MB |
| ISBN(s) : | 9780539034493 |
| Note : | This product is unavailable in Ukraine, Russia, Belarus |
| Number of Pages : | 26 |
| Product Code(s) : | 30389138, 30389138, 30389138 |
| Published : | 12/13/2019 |
| Same As : | BS PD ISO/TS 10867:2019 |
