BS PD ISO/TS 11888:2017 describes methods for the characterization of mesoscopic shape factors of multiwall
carbon nanotubes (MWCNTs). Techniques employed include scanning electron microscopy (SEM),
transmission electron microscopy (TEM), viscometry, and light scattering analysis.
This document also includes additional terms needed to define the characterization of static bending
persistence length (SBPL). Measurement methods are given for the evaluation of SBPL, which generally
varies from several tens of nanometres to several hundred micrometres.
Well-established concepts and mathematical expressions, analogous to polymer physics, are utilized
for the definition of mesoscopic shape factors of MWCNTs.
Cross References:ISO 9276-6:2008 Ed 1
ISO/TR 12885:2008 Ed 1
ISO/TS 80004-3:2010
All current amendments available at time of purchase are included with the purchase of this document. | File Size : | 1
file
, 2.5 MB |
| ISBN(s) : | 9780580924385 |
| Note : | This product is unavailable in Ukraine, Russia, Belarus |
| Number of Pages : | 26 |
| Product Code(s) : | 30333675, 30333675, 30333675 |
| Published : | 09/25/2017 |
| Same As : | BS PD ISO/TS 11888:2017 |
