Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 1: General conditions and definitions
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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions, TEM cell and wideband TEM cell method
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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
Document status: [ Revised ]
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
Document status: [ Revised ]
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday cage method
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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 6: Measurement of conducted emissions - Magnetic probe method
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Integrated circuits - Measurement of electromagnetic emissions Part 8: Measurement of radiated emissions - IC stripline method
Document status: [ Revised ]
Application integration at electric utilities - System interfaces for distribution management Part 100: Implementation profiles
Document status: [ Revised ]
Application integration at electric utilities - System interfaces for distribution management Part 11: Common information model (CIM) extensions for distribution
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