Semiconductor devices – Mechanical and climatic test methods – Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
Document status: [ Draft-Obsolete ]
Semiconductor devices – Mechanical and climatic test methods – Part 41: Standard reliability testing methods of non-volatile memory devices
Document status: [ Draft-Obsolete ]
Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
Document status: [ Draft-Obsolete ]
Industrial platinum resistance thermometers and platinum temperature sensors
Document status: [ Draft-Obsolete ]
Test on gases evolved during combustion of materials from cables – Part 3: Measurement of low level of halogen content by ion chromatography
Document status: [ Draft ]
Code for designation of colours
Document status: [ Draft-Obsolete ]
Rotating machinery – Test methods and apparatus for the measurement of the operational characteristics of brushes
Document status: [ Draft-Obsolete ]
Installations for electroheating and electromagnetic processing – Test methods for electroslag remelting furnaces
Document status: [ Draft ]
Optical fibres – Part 1-1: Measurement methods and test procedures – General and guidance
Document status: [ Draft-Obsolete ]
Optical fibres – Part 1-22: Measurement methods and test procedures – Length measurement
Document status: [ Draft-Obsolete ]
