IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification
Document status: Active
IEEE Standard for Describing On-Chip Scan Compression
Document status: Active
IEEE Standard for Memory Modeling in Core Test Language
Document status: Active
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
Document status: Active
IEEE Standard for a Smart Transducer Interface for Sensors and Actuators - Common Functions, Communication Protocols, and Transducer Electronic Data Sheet (TEDS) Formats
Document status: Active
IEEE Standard for a Smart Transducer Interface for Sensors and Actuators--Common Functions, Communication Protocols, and Transducer Electronic Data Sheet (TEDS) Formats
Document status: Active
IEEE Standard for a Smart Transducer Interface for Sensors and Actuators - Network Capable Application Processor Information Model
Document status: Active
IEEE Standard for a Smart Transducer Interface for Sensors and Actuators - Transducer to Microprocessor Communication Protocols and Transducer Electronic Data Sheet (TEDS) Formats
Document status: Active
IEEE Standard for a Smart Transducer Interface for Sensors and Actuators - Digital Communication and Transducer Electronic Data Sheet (TEDS) Formats for Distributed Multidrop Systems
Document status: Active
IEEE Standard for A Smart Transducer Interface for Sensors and Actuators--Mixed-Mode Communication Protocols and Transducer Electronic Data Sheet (TEDS) Formats
Document status: Active
