Nanomanufacturing - Key control characteristics - Part 6-6: Graphene - Strain uniformity: Raman spectroscopy
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Nanomanufacturing – Key control characteristics – Part 6-7: Graphene – Sheet resistance: van der Pauw method
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Nanomanufacturing – Key control characteristics – Part 6-8: Graphene – Sheet resistance: In-line four-point probe IEC
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Nanomanufacturing – Key control characteristics – Part 7-2: Nano-enabled photovoltaics – Device evaluation method for indoor light
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Nanomanufacturing - Key control characteristics - Part 8-1: Nano-enabled metal-oxide interfacial devices - Test method for defect states by thermally stimulated current
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Nanomanufacturing - Key control characteristics - Part 8-2: Nano-enabled metal-oxide interfacial devices - Test method for the polarization properties by thermally stimulated depolarization current
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Nanomanufacturing - Key Control Characteristics - Part 8-3: Nano-Enabled Metal-Oxide Interfacial Devices - Analog Resistance Change And Resistance Fluctuation: Electrical Resistance Measurement
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Nanomanufacturing - Key control characteristics - Part 9-1: Traceable spatially resolved nano-scale stray magnetic field measurements - Magnetic force microscopy
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Nanomanufacturing – Key control characteristics – Part 9-2: Nanomagnetic products – Magnetic field distribution: Magneto-optical indicator film technique
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Mechanical structures for electronic equipment - Thermal management for cabinets in accordance wit IEC 60297 and IEC 60917 series - Part 1: Design guide: Interface dimension and provision for thermoelectrical cooling systems (Peltier effect)
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