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CEI EN 60749-19/A1 PDF

CEI EN 60749-19/A1 PDF

Name:
CEI EN 60749-19/A1 PDF

Published Date:
11/01/2011

Status:
[ Active ]

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength

Publisher:
Comitato Elettrotecnico Italiano

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$4.2
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La presente Variante modifica la Norma CEI EN 60749-19:2004-11 relativa alla Prova di sollecitazione al taglio per semiconduttori.
In particolare la variazione consiste nell’aggiunta di una Nota nel Art. 1 "Campo di Applicazione". Relativamente alla sollecitazione allo sforzo di taglio in assiemi con e senza cavità.
Questa Variante viene pubblicata dal CEI nella sola lingua inglese in quanto particolarmente mirata a settori specialistici.
La presente Variante recepisce il testo originale inglese della Pubblicazione IEC.


Edition : 1
File Size : 1 file , 670 KB
Number of Pages : 8
Published : 11/01/2011

History

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