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CEI EN 60749-35 PDF

CEI EN 60749-35 PDF

Name:
CEI EN 60749-35 PDF

Published Date:
02/01/2012

Status:
[ Active ]

Description:

Semiconductor devices - Mechanical and climatic test methods Part 35: Acoustic microscopy for plastic encapsulated electronic components

Publisher:
Comitato Elettrotecnico Italiano

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$30.6
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This part of IEC 60749 defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components. This standard provides a guide to the use of acoustic microscopy for detecting anomalies (delamination, cracks, mould-compound voids, etc.) reproducibly and non-destructively in plastic packages.


Edition : 12
File Size : 1 file , 1 MB
Number of Pages : 28
Published : 02/01/2012

History

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