CEI EN 60749-35 PDF

Name:
CEI EN 60749-35 PDF

Published Date:
02/01/2012

Status:
[ Active ]

Description:

Semiconductor devices - Mechanical and climatic test methods Part 35: Acoustic microscopy for plastic encapsulated electronic components

Publisher:
Comitato Elettrotecnico Italiano

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

This part of IEC 60749 defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components. This standard provides a guide to the use of acoustic microscopy for detecting anomalies (delamination, cracks, mould-compound voids, etc.) reproducibly and non-destructively in plastic packages.

Edition :	12
File Size :	1 file , 1 MB
Number of Pages :	28
Published :	02/01/2012

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