CEI EN 60749-4 PDF

CEI EN 60749-4 PDF

Name:
CEI EN 60749-4 PDF

Published Date:
10/01/2017

Status:
[ Active ]

Description:

Semiconductor devices - Mechanical and climatic test methods Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Publisher:
Comitato Elettrotecnico Italiano

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Czech version):
200 business days

SKU:
cei-en-60749-4_2731260

Choose Document Language:
11.70 €
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This part of IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.


Edition : 17
File Size : 1 file , 750 KB
Number of Pages : 18
Published : 10/01/2017

History

CEI EN 60749-4
Published Date: 10/01/2017
Semiconductor devices - Mechanical and climatic test methods Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
11.70 €
CEI EN 60749-4
Published Date: 03/01/2004
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
6.30 €

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