CEI EN 60749-4 PDF

Name:
CEI EN 60749-4 PDF

Published Date:
10/01/2017

Status:
[ Active ]

Description:

Semiconductor devices - Mechanical and climatic test methods Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Publisher:
Comitato Elettrotecnico Italiano

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

This part of IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

Edition :	17
File Size :	1 file , 750 KB
Number of Pages :	18
Published :	10/01/2017

History

CEI EN 60749-4

Published Date: 10/01/2017

Semiconductor devices - Mechanical and climatic test methods Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

$11.7

CEI EN 60749-4

Published Date: 03/01/2004

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

$6.3

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CEI EN 60749-4 PDF

Semiconductor devices - Mechanical and climatic test methods Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

History

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