CEI EN 60749-7 PDF

CEI EN 60749-7 PDF

Name:
CEI EN 60749-7 PDF

Published Date:
06/01/2012

Status:
[ Active ]

Description:

Semiconductor devices - Mechanical and climatic test methods Part 7: Internal moisture content measurement and the analysis of other residual gases

Publisher:
Comitato Elettrotecnico Italiano

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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$11.7
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SAME AS IEC 60749-7

This International Standard specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of the quality of the sealing process and to provide information about the long-term chemical stability of the atmosphere inside the package. It is applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. This test is destructive.


Edition : 12
File Size : 1 file , 800 KB
Number of Pages : 16
Published : 06/01/2012

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