CEI EN 61010-031 PDF

CEI EN 61010-031 PDF

Name:
CEI EN 61010-031 PDF

Published Date:
11/01/2015

Status:
[ Active ]

Description:

Safety requirements for electrical equipment for measurement, control and laboratory use Part 031: Safety requirements for hand-held probe assemblies for electrical measurement and test

Publisher:
Comitato Elettrotecnico Italiano

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
$112.8
Need Help?
ENGLISH

Probe assemblies included in scope

This part of IEC 61010 specifies safety requirements for hand-held and hand-manipulated probe assemblies of the types described below, and their related accessories. These probe assemblies are for direct electrical connection between a part and electrical test and measurement equipment. They may be fixed to the equipment or be detachable accessories for the equipment.

a) Type A: low-voltage and high-voltage, non-attenuating probe assemblies. Non-attenuating probe assemblies that are RATED for direct connection to voltages exceeding 30 V r.m.s., 42,4 V peak, or 60 V d.c., but not exceeding 63 kV. They do not incorporate components which are intended to provide a voltage divider function or a signal conditioning function, but they may contain non-attenuating components such as fuses (see Figure 1.)

b) Type B: high-voltage attenuating or divider probe assemblies. Attenuating or divider probe assemblies that are RATED for direct connection to secondary voltages exceeding 1 kV r.m.s. or 1,5 kV d.c. but not exceeding 63 kV r.m.s. or d.c. The divider function may be carried out wholly within the probe assembly, or partly within the test or measurement equipment to be used with the probe assembly (see Figure 2).

c) Type C: low-voltage attenuating or divider probe assemblies. Attenuating or divider probe assemblies for direct connection to voltages not exceeding 1 kV r.m.s. or 1,5 kV d.c. The signal conditioning function may be carried out wholly within the probe assembly, or partly within the test or measurement equipment intended to be used with the probe assembly (see Figure 3).

d) Type D: low-voltage attenuating, non-attenuating or other signal conditioning probe assemblies, that are RATED for direct connection only to voltages not exceeding 30 V r.m.s., or 42,4 V peak, or 60 V d.c., and are suitable for currents exceeding 8 A (see Figure 4).

Probe assemblies excluded from scope

This standard does not apply to current sensors within the scope of IEC 61010-2-032 (Handheld and hand-manipulated current sensors), but may apply to their input measuring circuit leads and accessories.

 


Edition : 15#
File Size : 1 file , 1.6 MB
Number of Pages : 94
Published : 11/01/2015

History


Related products

CEI EN 60811-407
Published Date: 05/01/2014
Electric and optical fibre cables - Test methods for non-metallic materials Part 407: Miscellaneous tests - Measurement of mass increase of polyethylene and polypropylene compounds
$8.7
CEI EN 61280-2-10
Published Date: 01/01/2006
Fibre optic communication subsystem test procedures - Part 2-10: Digital systems - Time-resolved chirp and alphafactor measurement of laser transmitters
$22.8
CEI EN IEC 62769-7
Published Date: 11/01/2021
Field Device Integration (FDI) Part 7: Communication Devices
$41.1
CEI 57-9
Published Date: 05/01/1997
Sistemi ed apparecchiature di telecontrollo - Parte 1: Considerazioni generali - Sezione 2: Guida per l'emissione di specifiche
$7.8

Best-Selling Products

Thermodynamics Properties of Cryogenic Fluids
Published Date: 03/01/1997
$45.6