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CEI EN 61326-2-1 PDF

CEI EN 61326-2-1 PDF

Name:
CEI EN 61326-2-1 PDF

Published Date:
11/01/2013

Status:
[ Revised ]

Description:

Electrical equipment for measurement, control and laboratory use - EMC requirements Part 2-1: Particular requirements - Test configurations, operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected applications

Publisher:
Comitato Elettrotecnico Italiano

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$7.5
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ENGLISH * W/D S/S BY CEI EN IEC 61326-2-1

In addition to the scope of IEC 61326-1, this part of IEC 61326 specifies more detailed test configurations, operational conditions and performance criteria for equipment with test and measurement circuits (both internal and/or external to the equipment) that are not EMC protected for operational and/or functional reasons, as specified by the manufacturer.

The manufacturer specifies the environment for which the product is intended to be used and selects the appropriate test level specifications of IEC 61326-1.

NOTE Examples of equipment include, but are not limited to, oscilloscopes, logic analysers, spectrum analysers, network analysers, analogue instruments, digital multimeters (DMM) and board test systems.


Edition : 13
File Size : 1 file , 800 KB
Number of Pages : 16
Published : 11/01/2013

History

CEI EN IEC 61326-2-1
CEI EN IEC 61326-2-1
Published Date: 03/01/2022
Electrical equipment for measurement, control and laboratory use - EMC requirements Part 2-1: Particular requirements - Test configurations, operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected applications
$11.7
CEI EN 61326-2-1
CEI EN 61326-2-1
Published Date: 11/01/2013
Electrical equipment for measurement, control and laboratory use - EMC requirements Part 2-1: Particular requirements - Test configurations, operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected applications
$7.5

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