Name:
CEI EN 61745 PDF
Published Date:
03/01/2018
Status:
[ Active ]
Publisher:
Comitato Elettrotecnico Italiano
This document dcribes the calation of test ss that performnd-face ima analysis, alsoknown as “near-field” or “grey-scale” analysis”. The principles, however, can be applied to test sets of a different type.
The procudres outlined are performed by calibration laboratories and by the manufacturers or users of geometry test sets, for the purpose of calibrating geometry test sets and for evaluating the uncertainties in measurements made on calibrated test sets. The calibration of fibre coating or cable measurement test setrs is not covered by this document.
| Edition : | 18 |
| File Size : | 1 file , 2.3 MB |
| Number of Pages : | 48 |
| Published : | 03/01/2018 |