CEI EN 61788-15 PDF

This part of IEC 61788 describes measurements of the intrinsic surface impedance (Z_S) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method [13, 14]². The object of measurement is to obtain the temperature dependence of the intrinsic Z_S at the resonant frequency f₀.

The frequency and thickness range and the measurement resolution for the intrinsic Z_S of HTS films are as follows:

- frequency: up to 40 GHz;

- film thickness: greater than 50 nm;

- measurement resolution: 0,01 mΩ at 10 GHz.

The intrinsic Z_S data at the measured frequency, and that scaled to 10 GHz, assuming the f² rule for the intrinsic surface resistance R_S (f < 40 GHz) and the f rule for the intrinsic surface reactance X_S for comparison, shall be reported.