Name:
CEI EN 61788-16 PDF
Published Date:
10/01/2013
Status:
[ Active ]
Publisher:
Comitato Elettrotecnico Italiano
This part of IEC 61788 involves describing the standard measurement method of power-dependent surface resistance of superconductors at microwave frequencies by the sapphire resonator method. The measuring item is the power dependence of Rs at the resonant frequency.
The following is the applicable measuring range of surface resistances for this method:
Frequency: f ~ 10 GHz
Input microwave power: Pin < 37 dBm (5 W)
The aim is to report the surface resistance data at the measured frequency and that scaled to 10 GHz using the Rs ∝ f2 relation for comparison.
| Edition : | 13 |
| File Size : | 1 file , 1.3 MB |
| Number of Pages : | 38 |
| Published : | 10/01/2013 |
