CEI EN 61788-17 PDF

This part of IEC 61788 describes the measurements of the local critical current density (J_c) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine J_c at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure JJ_c in applied DC magnetic fields [20, 21]², the scope of this standard is limited to the measurement without DC magnetic fields.

This technique intrinsically measures the critical sheet current that is the product of J_c and the film thickness d. The range and measurement resolution for J_cd of HTS films are as follows:

– J_cd: from 200 A/m to 32 kA/m (based on results, not limitation);

– Measurement resolution: 100 A/m (based on results, not limitation).

² Numbers in square brackets refer to the Bibliography.