CEI EN 62047-10 PDF

CEI EN 62047-10 PDF

Name:
CEI EN 62047-10 PDF

Published Date:
07/01/2012

Status:
[ Active ]

Description:

Semiconductor devices - Microelectromechanical devices Part 10: Micro-pillar compression test for MEMS materials

Publisher:
Comitato Elettrotecnico Italiano

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Czech version):
200 business days

SKU:
cei-en-62047-10_2754993

Choose Document Language:
11.70 €
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This part of IEC 62047 specifies micro-pillar compression test method to measure compressive properties of MEMS materials with high accuracy, repeatability, and moderate effort of specimen fabrication. The uniaxial compressive stress-strain relationship of a specimen is measured, and the compressive modulus of elasticity and yield strength can be obtained.

The test piece is a cylindrical pillar fabricated on a rigid (or highly stiff) substrate by micromachining technologies, and its aspect ratio (ratio of pillar diameter to pillar height) should be more than 3. This standard is applicable to metallic, ceramic, and polymeric materials.


Edition : 12
File Size : 1 file , 880 KB
Number of Pages : 20
Published : 07/01/2012

History


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