CEI EN 62047-26 PDF

CEI EN 62047-26 PDF

Name:
CEI EN 62047-26 PDF

Published Date:
11/01/2016

Status:
[ Active ]

Description:

Semiconductor devices - Micro-electromechanical devices Part 26: Description and measurement methods for micro trench and needle structures

Publisher:
Comitato Elettrotecnico Italiano

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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Choose Document Language:
$15.9
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This part of IEC 62047 specifies descriptions of trench structure and needle structure in a micrometer scale. In addition, it provides examples of measurement for the geometry of both structures. For trench structures, this standard applies to structures with a depth of 1 μm to 100 μm; walls and trenches with respective widths of 5 μm to 150 μm; and aspect ratio of 0,006 7 to 20. For needle structures, the standard applies to structures with three or four faces with a height, horizontal width and vertical width of 2 μm or larger, and with dimensions that fit inside a cube with sides of 100 μm.

This standard is applicable to the structural design of MEMS and geometrical evaluation after MEMS processes.


Edition : 16
File Size : 1 file , 830 KB
Number of Pages : 36
Published : 11/01/2016

History


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